Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items

✍ Scribed by Aslam, Muhammad; Wu, Chien-Wei; Azam, Muhammad; Jun, Chi-Hyuck

• Book ID: 119191542
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 426 KB
• Volume: 37
• Category: Article
• ISSN: 0307-904X
• DOI: 10.1016/j.apm.2012.02.048