Vanadium speciation by EDXRF

✍ Scribed by N. Kallithrakas-Kontos; R. Moshohoritou

• Book ID: 101248686
• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 267 KB
• Volume: 27
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199805/06)27:3<173::aid-xrs266>3.0.co;2-p

✦ Synopsis

Elemental chemical speciation by measuring x-ray energy shifts has been carried out by various authors in the past, using tube excitation and wavelength detection. Among the most intense determined shifts are those of vanadium compounds ; further, vanadium speciation determination seems to be even more important than total element analysis. In this work, the possibility of vanadium compound speciation by measuring K x-ray line energy shifts was studied by using radioactive source excitation and detection by an energy-dispersive Si(Li) detector of moderate resolution. The e †ect of the Ðtting parameters to the results was examined for the and lines, K-L 2, 3 K-M 2, 3 and the results are compared with previous data obtained by wavelength-dispersive x-ray Ñuorescence.