𝔖 Bobbio Scriptorium
✦   LIBER   ✦

van der Pauw method for measuring resistivity of a plane sample with distant boundaries

✍ Scribed by Lim, S. H. N.; McKenzie, D. R.; Bilek, M. M. M.


Book ID
125459183
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
473 KB
Volume
80
Category
Article
ISSN
0034-6748

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


The Van der Pauw method for sheet resist
✍ J. Banaszczyk; A. Schwarz; G. De Mey; L. Van Langenhove πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 888 KB

## Abstract In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole‐coated woven para‐aramide fabrics and used a simple setup to measu