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Valence photoemission study of temperature dependent reaction products in Ni-Si interfaces and thin films

✍ Scribed by I. Abbati; L. Braicovich; B. De Michelis; U. del Pennino; S. Valeri


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
346 KB
Volume
43
Category
Article
ISSN
0038-1098

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