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Valence band edge of ultra-thin silicon oxide near the interface

✍ Scribed by H. Nohira; A. Omura; M. Katayama; T. Hattori

Book ID: 108418610
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 252 KB
Volume: 123-124
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(97)00568-0

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