✦ LIBER ✦

Vacuum depositing of thin films of iron in sealed system at very low pressures

✍ Scribed by V. Kamberský; L. Láska

Book ID: 112591886
Publisher: Springer
Year: 1965
Tongue: English
Weight: 117 KB
Volume: 15
Category: Article
ISSN: 0011-4626
DOI: 10.1007/bf01689256

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

948. Vacuum depositing thin films of iro

948. Vacuum depositing thin films of iron in a sealed system at very low pressures: V Kambersky and L Laska,Czech J Phys, 15, 1966, 434–435 (in Czech)

📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 138 KB

418. Vacuum-depositing of thin films of

418. Vacuum-depositing of thin films of iron in sealed systems at very low pressures: V Kampberský and L Láska, Czech J Phys, 15 (6), 1965, 434–435, (in Czech)

📂 Article 📅 1966 🏛 Elsevier Science 🌐 English ⚖ 134 KB

Vacuum depositing of thin films of iron

Vacuum depositing of thin films of iron in a seales system at very low pressure: V Kambersky and L Laska, Czech J Phys, 15(6), 1965, 434–435, (in English).

📂 Article 📅 1966 🏛 Elsevier Science 🌐 English ⚖ 137 KB

Vacuum arc deposition of carbon thin fil

Vacuum arc deposition of carbon thin films in a low pressure of hydrogen

✍ Douyon de Azevedo, M.; Meunier, J.-L. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 560 KB

Oxygen adsorption and electrical behavio

Oxygen adsorption and electrical behaviour of thin, very-low-pressure chemical-vapour-deposited polysilicon films

✍ B. Fortin; D. Mostefa; F. Raoult; H. Lhermite; M. Sarret 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 558 KB

Magnetic properties of oxidized iron thi

Magnetic properties of oxidized iron thin films grown by sputtering at very low temperatures

✍ F. Jiménez-Villacorta; A. Muñoz-Martín; R. Ramírez; C. Prieto 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 381 KB

Iron thin films have been grown by DC magnetron sputtering using Si(100) wafers as substrates, and then oxidized in a well-controlled oxygen atmosphere in the vacuum chamber. Film thickness is about 50 nm, and grains forming these samples do not exceed 20 nm. In order to control structural propertie