"Vacuum-baking encapsulation techniques and improved reliability of npn alloy transistors"

✍ Scribed by Burcham, N.P.; Miller, P.

• Book ID: 118696811
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1956
• Tongue: English
• Weight: 185 KB
• Volume: 3
• Category: Article
• ISSN: 0096-2430
• DOI: 10.1109/t-ed.1956.14125