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VA-5 a new approach to modeling ion implanted channels in MOSFETs and application to sensitivity analysis

✍ Scribed by Leiss, J.E.; Chatterjee, P.K.

Book ID: 114594265
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 91 KB
Volume: 29
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1982.20987

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