VA-1 Submicrometer self-aligned gate GaAs E/D MESFET's with VLSI compatible threshold voltage uniformity

✍ Scribed by Tan, K.L.; Chung, H.K.; Chen, C.H.; Cirillo, N.C., Jr.

• Book ID: 114596177
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 172 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.23294