Characterization of GaN Based UV-VUV Det
Characterization of GaN Based UV-VUV Detectors in the Range 3.4-25 eV by Using Synchrotron Radiation
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Motogaito, A. ;Ohta, K. ;Hiramatsu, K. ;Ohuchi, Y. ;Tadatomo, K. ;Hamamura, Y. ;
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Article
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2001
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John Wiley and Sons
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English
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