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Using thin film stress to produce precision, figured x-ray optics: Yuan, F; Shi, Y; Knight, L. V; Perkins, R. T; Allred, D. D. Thin Solid Films. Nov. 20; 220(1–2): 284–288


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
146 KB
Volume
15
Category
Article
ISSN
0141-6359

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