✦ LIBER ✦
Using the C-V curve of an mis diode to examine the trapping levels in a semiconductor containing many discrete traps
✍ Scribed by R.K. Cook; J.P. Kasold; K.A. Jones
- Book ID
- 107856519
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 617 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0038-1101
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