✦ LIBER ✦
Using surface charge analysis to characterize the radiation response of Si/SiO/sub 2/ structures
✍ Scribed by Stacey, J.W.; Schrimpf, R.D.; Fleetwood, D.M.; Holmes, K.C.
- Book ID
- 120539409
- Publisher
- IEEE
- Year
- 2004
- Tongue
- English
- Weight
- 277 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0018-9499
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