✦ LIBER ✦
Using simulators to model transmitted variability in IC manufacturing : Shahin Sharifzadeh, James R. Koehler, Art B. Owen and John D. Shott. IEEE Trans. Semiconductor Mfg2(3), 82 (1989)
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 136 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0026-2714
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