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Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs

✍ Scribed by Germán Álvarez-Botero; Reydezel Torres-Torres; Roberto Murphy-Arteaga


Book ID
104056463
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
836 KB
Volume
51
Category
Article
ISSN
0026-2714

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