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Using radial basis function neural networks to recognize shifts in correlated manufacturing process parameters

✍ Scribed by Deborah F. Cook; Chih-Chou Chiu


Book ID
110250152
Publisher
Taylor and Francis Group
Year
1998
Tongue
English
Weight
240 KB
Volume
30
Category
Article
ISSN
0740-817X

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This Book Constitutes The Thoroughly Refereed Post-proceedings Of The International Workshop On Software Measurement, Iwsm-mensura 2007, Held In Palma De Mallorca, Spain, In November 2007. The 16 Revised Full Papers Presented Were Carefully Reviewed And Selected For Inclusion In The Book. The Papers