Using quantitative electron microscopy for process mineralogy applications
β Scribed by P. Gottlieb; G. Wilkie; D. Sutherland; E. Ho-Tun; S. Suthers; K. Perera; B. Jenkins; S. Spencer; A. Butcher; J. Rayner
- Book ID
- 107518353
- Publisher
- The Minerals, Metals & Materials Society
- Year
- 2000
- Tongue
- English
- Weight
- 176 KB
- Volume
- 52
- Category
- Article
- ISSN
- 1047-4838
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
An image can be represented digitally as a matrix of numbers. When those numbers are linearly related to a property of the object, such as mass per unit area, a simple integration of an image area leads to a total of that property, such as the mass of a particle that is represented in a selected are
Although the Scanning Electron Microscope (SEM) has been in existence for many decades, it cannot be yet regarded as a true quantitative instrument-certainly when applied at the nanoscale. This is due to the presence of carbonaceous deposits at the surface and a poor understanding of the emission of