๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Using mosaic crystals for the generation of intense X-ray beams

โœ Scribed by A. N. Baldin; I. E. Vnukov; R. A. Shatokhin


Book ID
111449793
Publisher
SP MAIK Nauka/Interperiodica
Year
2007
Tongue
English
Weight
197 KB
Volume
33
Category
Article
ISSN
1063-7850

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Quality Assessment of Sapphire Wafers fo
โœ Chen, W.M. ;McNally, P.J. ;Shvydko, Yu.V. ;Tuomi, T. ;Lerche, M. ;Danilewsky, A. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 162 KB ๐Ÿ‘ 1 views

The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering