Using Magnetic and Optical Methods to Determine the Size and Characteristics of Nanoparticles Embedded in Oxide Semiconductors

✍ Scribed by Gehring, G.A.; Blythe, H.J.; Qi Feng; Score, D.S.; Mokhtari, A.; Alshammari, M.; Al Qahtani, M.S.; Fox, A.M.

• Book ID: 119819079
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 125 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2010.2041196