✦ LIBER ✦
Using genetic algorithms to detect interfacial cracks on the basis of the thermal resistance of multilayer materials
✍ Scribed by Chun-Yun Wu; Wen-Chang Lin
- Book ID
- 110210035
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2007
- Tongue
- English
- Weight
- 214 KB
- Volume
- 43
- Category
- Article
- ISSN
- 1061-8309
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