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Using far-infrared two-photon excitation to measure the resonant-polaron effect in the Reststrahlen band of GaAs:Si

✍ Scribed by P.C.M. Planken; H.P.M. Pellemans; P.C. van Son; J.N. Hovenier; T.O. Klaassen; W.Th. Wenckebach; P.W. Barmby; J.L. Dunn; C.A. Bates; C.T. Foxon; C.J.G.M. Langerak


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
476 KB
Volume
124
Category
Article
ISSN
0030-4018

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