✦ LIBER ✦
Using EWMA control schemes for monitoring wafer quality in negative binomial process
✍ Scribed by Fong-Jung Yu; Yung-Yu Yang; Ming-Jaan Wang; Zhang Wu
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 519 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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