Using Charge Accumulation to Improve the Radiation Tolerance of Multi-Gb NAND Flash Memories

✍ Scribed by Kay, Matthew J.; Gadlage, Matthew J.; Duncan, Adam R.; Ingalls, J. David; Savage, Mark W.

• Book ID: 121804603
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 894 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2013.2284511