Using Bulk Built-in Current Sensors to Detect Soft Errors

✍ Scribed by Neto, E.H.; Ribeiro, I.; Vieira, M.; Wirth, G.; Kastensmidt, F.L.

• Book ID: 115485027
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 214 KB
• Volume: 26
• Category: Article
• ISSN: 0272-1732
• DOI: 10.1109/mm.2006.103