Using an asymmetric error model to study aliasing in signature analysis registers

✍ Scribed by Xavier, D.; Aitken, R.C.; Ivanov, A.; Agarwal, V.K.

• Book ID: 119777554
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 942 KB
• Volume: 11
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.108615