𝔖 Bobbio Scriptorium
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Use of Wavelets to Compare Simulated Yield Patterns for Precision Agriculture at the Field Scale

✍ Scribed by A. (Jan) Verhagen; A. Stein; V. Epinat


Book ID
110312105
Publisher
Springer US
Year
2000
Tongue
English
Weight
429 KB
Volume
2
Category
Article
ISSN
1385-2256

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