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Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

โœ Scribed by V. T. Zhdan; A. V. Kozlovskii; A. N. Mozhaev; I. I. Pilyugin


Book ID
110212608
Publisher
SP MAIK Nauka/Interperiodica
Year
2010
Tongue
English
Weight
613 KB
Volume
65
Category
Article
ISSN
1061-9348

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