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Use of thin collodion films to prevent recoil-ion contamination of alpha-spectrometry detectors

✍ Scribed by K. G. W. Inn; E. Hall; J. T. Woodward; B. Stewart; R. Pollanen; L. Selvig; S. Turner; I. Outola; S. Nour; H. Kurosaki; J. LaRosa; M. Schultz; Z. Lin; Z. Yu; C. McMahon


Book ID
106440643
Publisher
Springer
Year
2008
Tongue
English
Weight
839 KB
Volume
276
Category
Article
ISSN
1588-2780

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