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Use of the Potential-Step Method to Measure Surface Oxides

โœ Scribed by Icenhower, D. E.; Urbach, H. B.; Harrison, J. H.


Book ID
118000390
Publisher
The Electrochemical Society
Year
1970
Tongue
English
Weight
818 KB
Volume
117
Category
Article
ISSN
0013-4651

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Digital simulation of potential step exp
โœ Jร–Rg Strutwolf; Wolfgang W. Schoeller ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 552 KB

For large values of the model diffusion coefficient the Crank-Nicolson scheme produces poor numerical results, if it is used for the simulation of a potential step experiment. On the other hand the Backward Euler or fully implicit scheme, not suffering from this drawback, is of lower accuracy. We ap