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Use of the modulating differentiation technique to study breakdown inhomogeneities in avalanche transit time silicon diode

✍ Scribed by R.V. Konakova; V.V. Rybalka; L.V. Scherbina; J.L. Zaitsevskii


Book ID
107856712
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
305 KB
Volume
27
Category
Article
ISSN
0038-1101

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