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Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data

✍ Scribed by Smigiel, R.; Knoll, A.; Broll, N.; Cornet, A.

Book ID: 121012270
Publisher: Trans Tech Publications, Ltd.
Year: 1998
Tongue: English
Weight: 383 KB
Volume: 278-281
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/MSF.278-281.170

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