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Use of screening and response surface experimental designs for development of a 0.5 μm CMOS self-aligned titanium silicide process : Robert E. Jones and Thomas C. Mele. IEEE Trans. Semicond. Mfg 4(4), 281 (1991)


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
108 KB
Volume
32
Category
Article
ISSN
0026-2714

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