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Use of related parameters in X-ray diffraction analysis of multilayer structures with allowance for the layer growth time

✍ Scribed by Yunin, P. A.; Drozdov, Yu. N.; Drozdov, M. N.; Novikov, A. V.; Yurasov, D. V.; Zakharov, N. D.; Korolev, S. A.

Book ID: 125395096
Publisher: Springer
Year: 2014
Tongue: English
Weight: 380 KB
Volume: 59
Category: Article
ISSN: 1063-7842
DOI: 10.1134/S1063784214030293

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