Use of radiation trapping for measuring electron-impact excitation cross sections for higher resonance levels of rare-gas atoms
โ Scribed by Stewart, M. D.; Chilton, J. Ethan; Boffard, John B.; Lin, Chun C.
- Book ID
- 120425035
- Publisher
- The American Physical Society
- Year
- 2002
- Tongue
- English
- Weight
- 169 KB
- Volume
- 65
- Category
- Article
- ISSN
- 1050-2947
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
## Den Annalen der Physik zum 200jiiArigen BesteiLen gewidnzet. A b s t r a c t . For electron energies from direct ionisation threshold up to several eV above cross scctions for the production of He+, He?+, Ne+ up to Ne4+, Kr2+, K?+ and Xe2+ up to Xe4+ ions by single electron impact on atoms were
\_I IO-' torr during measurcmcnts in dcpcndcncc on the tempcrature of the effusion chamber. L 1, Shimon et al, Z/r Tekh Fi;, 45 (3). 1975, 688-689 (in Rm~imr). I2 2365. Scattering of potassium and sodium ions on atoms of helium, neon, argon and xenon. (USSR)