Use of precision density and lattice parameter measurements for study of point defects in single crystals of semiconductors: II. Determination of homogeneity regions of compounds, the Vegard law application

✍ Scribed by A.N. Morozov; V.T. Bublik

• Book ID: 107789780
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 667 KB
• Volume: 75
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(86)90095-3