✦ LIBER ✦
Use of ion beam techniques to characterize thin plasma grown GaAs and GaAlAs oxide films
✍ Scribed by Robert L. Kauffman; L.C. Feldman; R.P.H. Chang
- Publisher
- Elsevier Science
- Year
- 1978
- Weight
- 295 KB
- Volume
- 149
- Category
- Article
- ISSN
- 0029-554X
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