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Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices

✍ Scribed by Sanka Ganesan; Michael Pecht; Sharon Ling


Book ID
108210543
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
115 KB
Volume
46
Category
Article
ISSN
0026-2714

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