Use of high lateral resolution secondary-ion mass spectrometry to characterize self-assembled monolayers on microfabricated structures

✍ Scribed by Frisbie, C. Daniel; Martin, John R.; Duff, Ronald R.; Wrighton, Mark S.

• Book ID: 126809401
• Publisher: American Chemical Society
• Year: 1992
• Tongue: English
• Weight: 879 KB
• Volume: 114
• Category: Article
• ISSN: 0002-7863
• DOI: 10.1021/ja00044a028