Use of electrical stress and isochronal annealing on power MOSFETs in order to characterize the effects of 60Co irradiation

✍ Scribed by C. Picard; C. Brisset; A. Hoffmann; J.-P. Charles; F. Joffre; L. Adams; A. Holmes Siedle

• Book ID: 108361786
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 551 KB
• Volume: 40
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(00)00182-7