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Upper critical field measurement and penetration depth determination for superconducting NbCN films

โœ Scribed by Moodera, J.; Francavilla, T.; Wolf, S.


Book ID
114648682
Publisher
IEEE
Year
1987
Tongue
English
Weight
381 KB
Volume
23
Category
Article
ISSN
0018-9464

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The current J and magnetic field H distributions in a thin film have been calculated for arbitrary changes of the external field (He). A joint solution of equations describing the field and current distributions in three different states (Meiuner, critical and mixed) taking into account a tangential