Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8

✍ Scribed by Y. Senba; H. Kishimoto; H. Ohashi; H. Yumoto; T. Zeschke; F. Siewert; S. Goto; T. Ishikawa

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 586 KB
• Volume: 616
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2009.12.007