Universal test set for detecting stuck-at and bridging faults in double fixed-polarity Reed-Muller programmable logic arrays

✍ Scribed by Rahaman, H.; Das, D.K.

• Book ID: 114448680
• Publisher: The Institution of Electrical Engineers
• Year: 2006
• Tongue: English
• Weight: 163 KB
• Volume: 153
• Category: Article
• ISSN: 1350-2387
• DOI: 10.1049/ip-cdt:20050079