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Universal scheme for measuring the electron in semiconductors and application to a lightly-doped -GaAs sample

✍ Scribed by J.S. Colton; K. Clark; D. Meyer; T. Park; D. Smith; S. Thalman

Book ID: 113915666
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 404 KB
Volume: 152
Category: Article
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2011.11.045

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