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[Univ. Tehran ICM 2000. Proceedings of the 12th International Conference on Microelectronics - Tehran, Iran (31 Oct.-2 Nov. 2000)] ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453) - Nonuniform coupled VLSI interconnect characterisation using genetic algorithms
✍ Scribed by Cheldavi, A.; Safavi-Naeini, S.; Kamarei, M.
- Book ID
- 111923434
- Publisher
- Univ. Tehran
- Year
- 2000
- Tongue
- Persian
- Weight
- 232 KB
- Volume
- 0
- Category
- Article
- ISBN-13
- 9789643600570
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