Unit cells and indexed X-ray powder patterns of two calcium zirconium silicates
✍ Scribed by P. E. D. Morgan; J. L. Hicks; H. A. Bump; M. S. Koutsoutis
- Publisher
- Springer
- Year
- 1987
- Tongue
- English
- Weight
- 227 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0261-8028
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## Abstract Least‐square refinement of x‐ray powder diffraction patterns analyzed by the Rietveld method can yield structural information which had been unattainable or at least elaborate to obtain by conventional pattern analysis. The Rietveld method calculates a powder pattern on the basis of a s
2,3,9,10,16,17,23,24-Octapentoxyphthalocyanine and its nickel derivative have been studied by means of electron and X-ray powder diffraction. The results reveal that the metal-free compound forms monoclinic crystals (space group C2/c) with unit cell constants a = 4.202 nm , b = 0.4977 nm , c = 3.345