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Uniformity improvement of linear power pHEMTs using a very high selective wet etching

✍ Scribed by X. Hue; B. Boudart; B. Bonte; Y. Crosnier


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
138 KB
Volume
23
Category
Article
ISSN
0895-2477

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✦ Synopsis


The realization and characterization of Al Ga Asr 0 .22 0 .78 In Ga AsrGaAs multifinger linear power pHEMTs, using a citric 0 .22 0 .78 acid selecti¨e wet etching for the gate recessing, are reported. A ¨ery high uniformity for both the drain current and pinch-off ¨oltage ¨alues ha¨e been obtained. The linearity is confirmed by a quasiflat profile of the ( ) transconductance and of the maximum a¨ailable gain MAG o¨er a wide gate source ¨oltage. Power and intermodulation distortion measurements at 16 GHz ha¨e been performed. An IP3 ¨alue of 25 dBm has been obtained for a 2 = 75 m de¨ice.