✦ LIBER ✦
Unified model for QBD prediction for thin gate oxide MOS devices with constant voltage and current stress
✍ Scribed by Mohammed T. Quddus; Thomas A. DeMassa; Julian J. Sanchez
- Book ID
- 114156028
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 695 KB
- Volume
- 51-52
- Category
- Article
- ISSN
- 0167-9317
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