Unified approach to breakdown phenomena in silicon p-n junction: Witold J. Stepowicz. Solid-St. Electron.22, 15 (1979)

• Book ID: 103276625
• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 95 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90006-4