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Uniaxial stress effects on the 3.4 eV optical structure of silicon by schottky-barrier electroreflectance

✍ Scribed by K. Kondo; A. Moritani; C. Hamaguchi; J. Nakai


Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
330 KB
Volume
15
Category
Article
ISSN
0038-1098

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