✦ LIBER ✦
Understanding the Effects of Epitaxy Artifacts on SiGe HBT Performance through Detailed Process/Device Simulation
✍ Scribed by Camillo-Castillo, R.; Johnson, J. B.; Liu, Q. Z.; Cheng, P.; Adkisson, J.; Harame, D. L.
- Book ID
- 121360706
- Publisher
- The Electrochemical Society
- Year
- 2013
- Tongue
- English
- Weight
- 262 KB
- Volume
- 50
- Category
- Article
- ISSN
- 1938-6737
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